Product Description:
Perform low current/voltage measurements at resolutions as low as sub-FA /µV for optimal DC measurement performance
The Power Supply/Measurement Unit (SMU) is the key measurement module of the Agilent B1500A semiconductor device analyzer. The SMU integrates a voltage/current source and measurement function to perform accurate DC current-voltage (IV) measurements at resolutions as low as fA /µV. The optional ASU (Automatic Sensing and Switching Unit) extends low current measurement performance down to the sub-FA range, giving you even higher measurement performance.
SMU can also perform quasi-static capacitance-voltage (QS-CV) measurements. It not only has low frequency CV characteristics, but also is an important measurement method to characterize the surface state of gate transistors and high frequency CV. The Agilent B1500A supports accurate QS-CV measurement and leakage current compensation.
For semiconductors, nanodevices (such as carbon nanotubes (CNT) and carbon nanowires (CNW)), active/passive components, materials and any electrical device that require precision voltage/current measurement, SMU is ideally suited to characterize these devices in combination with the analytical and data management capabilities of EasyEXPERT software.
Precise time-dependent characterization (such as pulse and sampling measurements) with hardware clock precision timing control
In addition to the DC measurement function, the Agilent B1500A SMU also has advanced time-dependent measurement functions, including pulse potential measurement and sampling measurement. Pulse and sampling measurements can identify and capture dynamic features. Timing accuracy is one of the important factors in time dependent measurement. The Agilent B1500A SMU utilizes the hardware clock precision timing control function to perform accurate measurements. The minimum sampling measurement interval is as low as 100μs, and the minimum pulse width is 500μs.
The Agilent B1500A offers 3 SMUs to meet your test needs.
Features:
Dc and time-dependent measurements give you confidence in the results of current-voltage (IV) measurements
4-quadrant power supply and measurement capabilities allow you to perform accurate current-voltage (IV) characterization in the range as low as fA (femtoamps)
· Measuring range is 0.1 fA-1 A / 0.5 µV-200 V
· Provide point measurement, scan measurement, pulse and sample measurement functions
· The minimum sampling measurement interval is 100μs
· Minimum pulse width is 500μs, using 2μs resolution
Quasi-static capacitance-voltage (QS-CV) measurement with leakage current compensation
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